Study of the Optical and Structural Properties of Perovskite Thin Films Prepared by Two Sequential Deposition Techniques at Room Temperature

Abstract

Perovskite thin films are widely used in optoelectronic applications because of their special properties, such as low cost, the tunable bandgap and the lifetime of the thin film. Several manufacturing techniques have been used to prepare perovskite thin films, like dip coating, spin coating, evaporation technique, etc. Solar cells efficiency prepared with perovskite thin films reached to 22.1% in 2016. This research work is about studying the perovskite thin-film characteristics, using first the method of spin-coating technique for the PbI? thin film preparation on a glass substrate and then preparing perovskite thin film by dip-coating technique, the whole process was conducted at room temperature. Characteristics features of perovskite thin films were investigated using UV-VIS spectroscopy, X-ray diffraction (XRD), furrier transmission infrared (FTIR) spectrum, diffused reflection spectrum (DRS), field emission scanning electron microscope (FESEM), and EDS. The results manifested the perovskite thin film with optical band gap (1.6-1.8 eV), low absorbance compared with other studies because of the solvent type used, and a dense thin film with low homogeneity.